Sequential Screening in Semiconductor Manufacturing I: Exploiting Lot-to-Lot Variability (Classic Reprint)


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Excerpt from Sequential Screening in Semiconductor Manufacturing I: Exploiting Lot-to-Lot Variability

Chips per wafer. According to Cunningham, the goal of most of the chip yield modelingresearch has been to predict costs and actual yields, and to determine the appropriate level of circuit integration. Albin and Friedman's (1989) work on acceptance sampling appears to be the first to employ a yield model in a quality control context; they use a two parameter distribution (the Neyman type A, which is a Poisson compounded Poisson) to model the number of defective chips on a wafer. Because they were interested in quality control issues rather than circuit design issues, they directly modeled the yield without.

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Publisher - Forgotten Books

Author(s) - Jihong Ou


Published Date -

ISBN - 9780483688902

Dimensions - 22.9 x 15.2 x 0.5 cm

Page Count - 38


Published Date -

ISBN - 9781332281473

Dimensions - 22.9 x 15.2 x 0.2 cm

Page Count - 40

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